Instrument make: Bruker nanoscope multimode 8 AFM. Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM). It is a high-resolution imaging technique (up to 0.1-10 nm) used to analyze surface topography, roughness, and material properties at the nanoscale. Using a sharp tip on a cantilever, AFM measures mechanical forces (Van der Waals) to create 3D maps of conductive, insulating, and biological samples.
